Vernalization of immature embryos of winter wheat genotypes

Summary The effect of direct vernalization of immature embryos on flowering was studied in six winter wheat genotypes. Fourteen-, 17-, and 20-day-old embryos were excised and vernalized for 0–6 weeks on synthetic medium during a conditioning period. Percent germination of embryos was high (overall 96.1%), and free from genotypic effects. Genotypes differed for flowering in response to cold treatment of excised embryos. Embryo vernalization was as effective as or more than conventional vernalization (control, seedling vernalization for 6 weeks). Seventeen-day-old embryos were the most responsive to vernalization. With a 5-week vernalization of 17-day-old embryos, the percentage of plants anthesed was higher than those from 14-and 20-day-old embryos. For 17-day-old embryos vernalized for 5 weeks, the mean number of days from culture to anthesis was less than that of 6 week vernalization, less than that of 14- and 20-day-old embryos, and less than controls.Purdue Univ., Agronomy Dept., W. Lafayette, IN 47907, USA.     

Wheat grain yield and stability assessed through regional trials in the Eastern Gangetic Plains of South Asia

Improving the level and stability of grain yield is the primary objective of wheat breeding programs in the Eastern Gangetic Plains (EGP) of South Asia. A regional wheat trial, the Eastern Gangetic Plains Yield Trial (EGPYT), was initiated by CIMMYT in collaboration with national wheat research programs in Bangladesh, Nepal, and India in 1999–2000 to identify wheat genotypes with high and stable grain yield, disease resistance, and superior agronomic traits for the EGP region. A set of 21 wheat experimental genotypes selected from a regional wheat screening nursery in South Asia, three improved widely grown cultivars (Kanchan, PBW343 and Bhrikuti), and one long-term cultivar (Sonalika) were tested at 9–11 sites in six wheat growing seasons (2000–2005) in the EGP. The 21 experimental genotypes were different in each year, whereas the four check cultivars were common. In each year, one or more of the experimental genotypes showed high and stable grain yield and acceptable maturity, plant height, and disease resistance compared to the check cultivars. Three improved cultivars have already been commercially released in the region through EGPYT and many germplasm lines have been used in the breeding programs as parents. Identification of wheat genotypes with high-grain yield in individual sites and high and stable yield across the EGP region underlines their value for regional wheat breeding programs attempting to improve grain yield and agronomic performance.     

Genotypic effects of sorghum accessions on fecundity of sorghum head bug,Calocoris angustatus Lethiery

Summary Sorghum head bug (Calocoris angustatus Leth.) (Hemiptera: Miridae) is an important pest of grain sorghum in India. We studied the fecundity of head bug females reared for one to three generations on head bug-resistant and head bug-susceptible genotypes during the 1988 and 1989 rainy and 1988–89 post-rainy seasons. Head bug population increase was lower for the first, second and/or third generation when the bugs were reared on IS 2761, IS 19955, IS 14334, IS 23748, IS 16357, IS 17610, and IS 21444 compared with the susceptible controls CSH 1, CSH 5, and CSH 9. These genotypes also suffered a low grain damage (damage rating (DR) 5) (except IS 2761) compared with the susceptible controls (DR>6). A marginal decrease in fecundity was observed when the bugs were reared on IS 2761, IS 14334, IS 16357, IS 20740 and IS 17610 and then transferred to the susceptible control, CSH 1. Sorghum genotypes having lower increase in bug population across generations, suffering low grain damage, and showing adverse effects on fecundity can be used in breeding for resistance to head bugs.     

High yielding spring bread wheat germplasm for global irrigated and rainfed production systems

Global wheat (Triticum aestivum L.) production must increase 2% annually until 2020 to meet future demands. Breeding wheat cultivars with increased grain yield potential, enhanced water-use efficiency, heat tolerance, end-use quality, and durable resistance to important diseases and pests can contribute to meet at least half of the desired production increases. The remaining half must come through better agronomic and soil management practices and incentive policies. Analyses of the recent International Yield Trials indicate that grain yields of the best new entries were usually 10% higher than the local checks globally, as well as within a country across sites. Variation in yield across sites within a country/region underline the role of genotype × environment (GE) interaction and provides opportunities to select for stable genotypes, which is not often done. The lack of proper analysis undermines proper utilization of germplasm with high yield potential and stability in the national wheat breeding programs. Some of the best performers in irrigated areas were amongst the best in semiarid environments, reinforcing the fact that high yield potential and drought tolerance can be improved simultaneously. The best performing lines often had genotypic base of widely adapted genotypes Kauz, Attila, Baviacora, and Pastor, with genetic contributions from other parents including synthetic wheat. We recommend within country multilocation analysis of trial performance for a crop season to identify lines suiting particular or different locations within a country. The immediate feedback on GE interaction will also help in breeding lines for countries having substantial variation across locations and years.     

Environmental factors influence the expression of resistance to sorghum midge, Stenodiplosis sorghicola

Host plant resistance is an effective means of controlling sorghum midge (Stenodiplosis sorghicola). We studied the influence of environmental factors on expression of resistance to sorghum midge in three midge-resistant and two midge-susceptible genotypes. Midge-resistant lines AF 28, ICSV 197, and TAM 2566 suffered 8.8 to 17.3% damage across seven so wings compared to 25.6%damage in ICSV 112, and 69.4% damage in CSH 5. Susceptibility of the midge-resistant lines (AF 28, ICSV 197, and TAM 2566) decreased with an increase in open pan evaporation, maximum and minimum temperatures, and solar radiation; while the midge-susceptible lines (ICSV 112 and CSH 5) showed a poor interaction with these factors. Midge damage in ICSV 197 showed a negative correlation with minimum temperature and relative humidity and positive correlation with sunshine hours,while the reverse was true for CSH 5. Grain growth rate between 0 and 3 days after anthesis was lower in crops sown on 1st October, when AF 28 and ICSV 197 suffered maximum midge damage. Maximum and minimum temperatures and maximum relative humidity influenced the moisture content of the grain, grain growth rate, and sorghum midge damage. There was considerable variation in genotype × environment interaction for expression of resistance to sorghum midge,and the implications of these results have been discussed in relation to development of sorghum cultivars with resistance to this insect. This revised version was published online in August 2006 with corrections to the Cover Date.     

Marker‐assisted backcross breeding to combine multiple rust resistance in wheat

A widely grown but rust susceptible Indian wheat variety HD2932 was improved for multiple rust resistance by marker‐assisted transfer of genes Lr19, Sr26 and Yr10. Foreground and background selection processes were practised to transfer targeted genes with the recovery of the genome of HD2932. The near‐isogenic lines (NILs) of HD2932 carrying Lr19, Sr26 and Yr10 were individually produced from two backcrosses with recurrent parent HD2932. Marker‐assisted background selection of NILs with 94.38–98.46% of the HD2932 genome facilitated rapid recovery of NILs carrying Lr19, Sr26 and Yr10. In the BC₂F₂ generation, NILs were intercrossed and two gene combinations of Lr19+Yr10, Sr26 + Yr10 and Lr19+Sr26 were produced. A total of 16 progeny of two gene combinations of homozygous NILs of HD2932 have been produced, which are under seed increase for facilitating the replacement of the susceptible HD2932 with three of the sixteen improved backcross lines with resistance to multiple rusts.     

Fusarium wilt of chickpea: physiological specialization, genetics of resistance and resistance gene tagging

Chickpea wilt caused by Fusarium oxysporum f. sp. ciceris is one of the major yield limiting factors in chickpea. The disease causes 10–90% yield losses annually in chickpea. Eight physiological races of the pathogen (0, 1A, 1B/C, 2, 3, 4, 5 and 6) are reported so far whereas additional races are suspected from India. The distribution pattern of these races in different parts of the world indicates regional specificity for their occurrence leading to the perception that F. oxysporum f. sp. ciceris evolved independently in different regions. Pathogen isolates also exhibit differences in disease symptoms. Races 0 and 1B/C cause yellowing syndrome whereas 1A, 2, 3, 4, 5 and 6 lead to wilting syndrome. Genetics of resistance to two races (1B/C and 6) is yet to be determined, however, for other races resistance is governed either by monogenes or oligogenes. The individual genes of oligogenic resistance mechanism delay onset of disease symptoms, a phenomenon called as late wilting. Slow wilting, i.e., slow development of disease after onset of disease symptoms also occurs in reaction to pathogen; however, its genetics are not known. Mapping of wilt resistance genes in chickpea is difficult because of minimal polymorphism; however, it has been facilitated to great extent by the development of sequence tagged microsatellite site (STMS) markers that have revealed significant interspecific and intraspecific polymorphism. Markers linked to six genes governing resistance to six races (0, 1A, 2, 3, 4 and 5) of the pathogen have been identified and their position on chickpea linkage maps elucidated. These genes lie in two separate clusters on two different chickpea linkage groups. While the gene for resistance to race 0 is situated on LG 5 of Winter et al. (Theoretical and Applied Genetics 101:1155–1163, 2000) those governing resistance to races 1A, 2, 3, 4 and 5 spanned a region of 8.2 cM on LG 2. The cluster of five resistance genes was further subdivided into two sub clusters of 2.8 cM and 2.0 cM, respectively. Map-based cloning can be used to isolate the six genes mapped so far; however, the region containing these genes needs additional markers to facilitate their isolation. Cloning of wilt resistance genes is desirable to study their evolution, mechanisms of resistance and their exploitation in wilt resistance breeding and wilt management.     

Widening the gene pool of cultivated lentils through introgression of alien chromatin from wild Lens subspecies

Wild Lens species/subspecies are a potential source for increasing genetic diversity in cultivated lentil. Four intraspecific crosses were attempted between cultivated and wild lentils. Viable hybrids were produced between L. culinaris ssp. culinaris × L. culinaris ssp. orientalis and L. culinaris ssp. culinaris × L. culinaris ssp. odomensis. Normal meiosis and pollen fertility were observed in the first set of crosses, whereas chromosomal abnormalities and reduced pollen fertility were observed in the second set of crosses. These crosses were also studied for some quantitative traits. The range, mean and coefficient of variation were calculated in parents, F₁, F₂ and BC₁ generations to determine the extent of variability generated in the cultivated lentil through introgression of genes from wild lentil. The cultivated lentil × L. culinaris ssp. orientalis crosses showed substantially higher variability for all the traits than crosses involving cultivated lentil ×L. culinaris ssp. odomensis. The results of the present study indicated that these wild subspecies can be exploited for breeding purposes and their variation can easily be utilized to widen the genetic base of the cultivated lentil.